Electronic device

ABSTRACT

Provided are, among others, memory circuits or devices and their applications in electronic devices or systems and various implementations of an electronic device which includes a semiconductor memory unit including one or more column, a data line, and a data line bar connected with a column selected among the one or more columns. Each of the one or more columns may include a plurality of storage cells each configured to store 1-bit data, each storage cell including a first and a second variable resistance elements; a bit line connected to one end of the first variable resistance element; a bit line bar connected to one end of the second variable resistance element; a source line connected to the other ends of the first and second variable resistance elements; and a driving block configured to latch data of the data line and the data line bar.

CROSS-REFERENCE TO RELATED APPLICATIONS

This patent document claims priority of Korean Patent Application No.10-2014-0050034, entitled “ELECTRONIC DEVICE” and filed on Apr. 25,2014, which is incorporated herein by reference in its entirety.

BACKGROUND 1. Field

This patent document relates to memory circuits or devices and theirapplications in electronic devices or systems.

2. Description of the Related Art

Recently, as electronic devices or appliances trend towardminiaturization, low power consumption, high performance,multi-functionality, and so on, there is a demand for semiconductor orelectronic devices capable of storing information in various electronicdevices or appliances such as a computer, a portable communicationdevice, and so on, and research and development for such electronicdevices have been conducted. Examples of such semiconductor orelectronic devices include electronic devices which can store data usinga characteristic that they are switched between different resistancestates according to an applied voltage or current, and can beimplemented in various configurations, for example, an RRAM (resistiverandom access memory), a PRAM (phase change random access memory), anFRAM (ferroelectric random access memory), an MRAM (magnetic randomaccess memory), an E-fuse, etc.

SUMMARY

Various implementations are directed to an electronic device in which astorage cell includes two variable resistance elements, therebyincreasing the margin and speed of read and write operations.

Also, various implementations are directed to an electronic device inwhich the degree of integration of storage cells each including twovariable resistance elements is increased.

In one aspect, an electronic device is provided to include asemiconductor memory unit which includes: one or more columns; and adata line and a data line bar connected with a column selected among theone or more columns. Each of the one or more columns may include aplurality of storage cells each configured to store 1-bit data, eachstorage cell including a first variable resistance element which has afirst resistance value when a first value is stored therein and a secondresistance value when a second value is stored therein and a secondvariable resistance element which has the second resistance value whenthe first value is stored therein and the first resistance value whenthe second value is stored therein; a bit line connected to one end ofthe first variable resistance element; a bit line bar connected to oneend of the second variable resistance element; a source line connectedto the other ends of the first and second variable resistance elements;and a driving block configured to latch data of the data line and thedata line bar when a corresponding column is selected, the driving blockconfigured to, in a write operation, drive the bit line and the bit linebar with a first voltage and a second voltage based on a value of thelatched data, and the driving block further configured to, in a readoperation, latch data corresponding to a current flowing through the bitline and the bit line bar.

In some implementations, in the write operation, resistance values ofthe first variable resistance element and the second variable resistanceelement may be switched according to directions of currents flowingthrough the first variable resistance element and the second variableresistance element, respectively.

In some implementations, in the read operation, the driving block maylatch the first value when an amount of a current flowing through thebit line is larger than an amount of a current flowing through the bitline bar, and latch the second value when an amount of a current flowingthrough the bit line is smaller than an amount of a current flowingthrough the bit line bar.

In some implementations, each of the plurality of storage cells mayinclude: a first selection element connected between the first variableresistance element and the source line, and configured to be turned onor off in response to a voltage of a corresponding word line; and asecond selection element connected between the second variableresistance element and the source line, and configured to be turned onor off in response to the voltage of the corresponding word line.

In some implementations, each of the one or more columns may include: afirst driving line connected to one end of the driving block, andconfigured to be connected with the data line when a correspondingcolumn is selected; and a second driving line connected to the other endof the driving block, and configured to be connected with the data linebar when the corresponding column is selected, wherein the driving blockdrives the bit line through the first driving line and drives the bitline bar through the second driving line.

In some implementations, when activated, the driving block may drive thefirst driving line with one voltage of the first voltage and the secondvoltage and drive the second driving line with the other voltage, andwhen deactivated, the driving block may precharge the first driving lineand the second driving line with one voltage of the first voltage andthe second voltage.

In some implementations, in the write operation, the driving block maydrive the first driving line with the first voltage and the seconddriving line with the second voltage when the value of the latched datais the first value, and drive the first driving line with the secondvoltage and the second driving line with the first voltage when thevalue of the latched data is the second value.

In some implementations, in the read operation, the driving block maydrive the first driving line and the second driving line with the firstvoltage and the second voltage, respectively, when the amount of currentflowing through the bit line is larger than the amount of currentflowing through the bit line bar, and drive the first driving line andthe second driving line with the second voltage and the first voltage,respectively, when the amount of current flowing through the bit line issmaller than the amount of current flowing through the bit line bar.

In some implementations, the source line may be floated in the writeoperation and is applied with a ground voltage in the read operation.

In some implementations, one or more storage cells of the plurality ofstorage cells may be sequentially disposed on one side of the drivingblock, and remaining storage cells may be sequentially disposed on theother side of the driving block.

In some implementations, the driving block may include: a first PMOStransistor having one end which is connected to the first driving lineand the other end which is applied with a power supply voltage, andconfigured to be turned on and off in response to a voltage of thesecond driving line; a second PMOS transistor having one end which isconnected to the second driving line and the other end which is appliedwith the power supply voltage, and configured to be turned on and off inresponse to a voltage of the first driving line; a first NMOS transistorhaving one end which is connected to the first driving line and theother end which is connected to an internal node, and configured to beturned on and off in response to the voltage of the second driving line;a second NMOS transistor having one end which is connected to the seconddriving line and the other end which is connected to the internal node,and configured to be turned on and off in response to the voltage of thefirst driving line; and a third NMOS transistor having one end which isconnected to the internal node and the other end which is applied withthe ground voltage, and configured to be turned on and off in responseto an enable signal which is activated during an activation period ofthe driving block and is deactivated during a deactivation period of thedriving block.

In some implementations, each of the one or more columns may include: afirst sourcing connection element connected between the bit line and thefirst driving line, and configured to be turned on or off in response toa clamp signal; a second sourcing connection element connected betweenthe bit line bar and the second driving line, and configured to beturned on or off in response to the clamp signal; and a sinkingconnection element connected between the source line and a terminal ofthe ground voltage, and configured to be turned on or off in response toa read sinking signal, wherein the clamp signal and the read sinkingsignal are activated during a period in which data of a selected storagecell is latched to the driving block.

In some implementations, each of the one or more columns may include: afirst write connection element connected between the bit line and thefirst driving line, and configured to be turned on in the writeoperation; and a second write connection element connected between thebit line bar and the second driving line, and configured to be turned onin the write operation.

In some implementations, each of the one or more columns may include: afirst column selection element connected between the first driving lineand the data line, and configured to be turned on or off in response toa corresponding column select signal; and a second column selectionelement connected between the second driving line and the data line bar,and configured to be turned on or off in response to the correspondingcolumn select signal.

In some implementations, the driving block may drive both ends with samevoltage level during a precharge period.

In some implementations, the driving block may further include: a thirdPMOS transistor having one end which is connected to the first drivingline and the other end which is connected to the second driving line,and configured to be turned on and off in response to the enable signal.

In some implementations, the third PMOS transistor may turn off when theenable signal is activated, and turn on when the enable signal isdeactivated.

In some implementations, the first variable resistance element and thesecond variable resistance element may include a metal oxide and have astructure in which a tunnel barrier layer is interposed between twoferromagnetic layers.

In some implementations, the electronic device further comprises amicroprocessor which includes: a control unit that is configured toreceive a signal including a command from an outside of themicroprocessor, and performs extracting, decoding of the command, orcontrolling input or output of a signal of microprocessor; and anoperation unit configured to perform an operation based on a result thatthe control unit decodes the command; and a memory unit configured tostore data for performing the operation, data corresponding to a resultof performing the operation, or an address of data for which theoperation is performed, wherein the semiconductor memory unit thatincludes the variable resistance element is part of the memory unit inthe microprocessor.

In some implementations, the electronic device further comprises aprocessor which includes: a core unit configured to perform, based on acommand inputted from an outside of the processor, an operationcorresponding to the command, by using data; a cache memory unitconfigured to store data for performing the operation, datacorresponding to a result of performing the operation, or an address ofdata for which the operation is performed; and a bus interface connectedbetween the core unit and the cache memory unit, and configured totransmit data between the core unit and the cache memory unit, whereinthe semiconductor memory unit that includes the variable resistanceelement is part of the cache memory unit in the processor.

In some implementations, the electronic device further comprises aprocessing system which includes: a processor configured to decode acommand received by the processor and control an operation forinformation based on a result of decoding the command; an auxiliarymemory device configured to store a program for decoding the command andthe information; a main memory device configured to call and store theprogram and the information from the auxiliary memory device such thatthe processor can perform the operation using the program and theinformation when executing the program; and an interface deviceconfigured to perform communication between the processor, the auxiliarymemory device or the main memory device and the outside, wherein thesemiconductor memory unit that includes the variable resistance elementis part of the auxiliary memory device or the main memory device in theprocessing system.

In some implementations, the electronic device further comprises a datastorage system which includes: a storage device configured to store dataand conserve stored data regardless of power supply; a controllerconfigured to control input and output of data to and from the storagedevice according to a command inputted form an outside; a temporarystorage device configured to temporarily store data exchanged betweenthe storage device and the outside; and an interface configured toperform communication between at least one of the storage device, thecontroller and the temporary storage device and the outside, wherein thesemiconductor memory unit that includes the variable resistance elementis part of the storage device or the temporary storage device in thedata storage system.

In some implementations, the electronic device may further include amemory system which includes a memory configured to store data andconserve stored data regardless of power supply; a memory controllerconfigured to control input and output of data to and from the memoryaccording to a command inputted form an outside; a buffer memoryconfigured to buffer data exchanged between the memory and the outside;and an interface configured to perform communication between at leastone of the memory, the memory controller and the buffer memory and theoutside, wherein the semiconductor memory unit that includes thevariable resistance element is part of the memory or the buffer memoryin the memory system.

In another aspect, an electronic device is provided to include asemiconductor memory unit which includes: a cell array including aplurality of storage cells which are connected with the first bit linesand first bit line bars or with second bit lines and second bit linebars, wherein the first bit lines and the first bit line bars aredisposed on a first side of the cell array and the second bit lines andthe second bit line bars are disposed on a second side of the cellarray, and each storage cell stores 1-bit data and includes a firstvariable resistance element having a first resistance value when a firstvalue is stored therein and a second resistance value when a secondvalue is stored therein and a second variable resistance element havingthe second resistance value when the first value is stored therein andthe first resistance value when the second value is stored therein; afirst data line and a first data line bar disposed on the first side ofthe cell array; a second data line and a second data line bar disposedon the second side of the cell array; one or more first driving blocksdisposed on the first side of the cell array and connected to thestorage cells through the first bit lines and the first bit line bars,each driving block configured, during a write operation, to latch dataof a corresponding first data line and a corresponding first data linebar and drive the corresponding first bit line and the correspondingfirst bit line bar with a first voltage or a second voltage according toa value of the latched data and configured, during a read operation,latch data stored in a corresponding storage cell based on a currentflowing through the corresponding first bit line and the correspondingfirst bit line bar; and one or more second driving blocks disposed onthe second side of the cell array, and connected to storage cellsthrough the second bit lines and the second bit line bars, each seconddriving block configured, during a write operation, to latch data of acorresponding second data line and a corresponding second data line barand drive the corresponding second bit line and the corresponding secondbit line bar with a first voltage or a second voltage according to avalue of the latched data and configured, during a read operation tolatch data stored in a corresponding storage cell based on currentflowing through the corresponding second bit line and the correspondingsecond bit line bar.

In some implementations, the semiconductor memory unit may include: aplurality of source lines to which a ground voltage is applied duringthe read operation and are floated during the write operation, andwherein one end of each first variable resistance element is connectedto a corresponding bit line, one end of each second variable resistanceelement is connected to a corresponding bit line bar, and the other endsof the first and second variable resistance elements are connected to acorresponding source line.

In some implementations, in the write operation, resistance values ofthe first variable resistance element and the second variable resistanceelement may be switched to the first resistance value when current flowsfrom the other ends to the one ends and be switched to the secondresistance value when current flows from the one ends to the other ends.

In some implementations, the at least one first driving block and the atleast one second driving block may latch the first value when an amountof current flowing thorough the bit line is larger than an amount ofcurrent flowing through the bit line bar, and latch the second valuewhen an amount of current flowing thorough the bit line is smaller thanan amount of current flowing through the bit line bar.

In some implementations, each driving block may be further connected toa first driving line and a second driving line on both ends thereof,respectively, and configured such that, when a corresponding drivingblock is selected, the first driving line and the second driving lineare connected with a corresponding data line and a corresponding dataline bar, respectively, and wherein the driving block drives the bitline through the first driving line and the bit line bar through thesecond driving line.

In some implementations, in the write operation, each first drivingblock and each second driving block may drive the first driving linewith the first voltage and the second driving line with the secondvoltage when the value of the latched data is the first value, and drivethe first driving line with the second voltage and the second drivingline with the first voltage when the value of the latched data is thesecond value.

In some implementations, in the read operation, each first driving blockand each second driving block may drive the first driving line and thesecond driving line with the first voltage and the second voltage,respectively, when the amount of current flowing through the bit line isgreater than the amount of current flowing through the bit line bar, anddrive the first driving line and the second driving line with the secondvoltage and the first voltage, respectively, when the amount of currentflowing through the bit line is smaller than the amount of currentflowing through the bit line bar.

In some implementations, each of the first and second driving blocks maydrive both ends with same voltage level during a precharge period.

In some implementations, each of the first and second driving blocks mayinclude: a first PMOS transistor having one end which is connected tothe first driving line and the other end which is applied with a powersupply voltage, and configured to be turned on and off in response to avoltage of the second driving line; a second PMOS transistor having oneend which is connected to the second driving line and the other endwhich is applied with the power supply voltage, and configured to beturned on and off in response to a voltage of the first driving line; afirst NMOS transistor having one end which is connected to the firstdriving line and the other end which is connected to an internal node,and configured to be turned on and off in response to the voltage of thesecond driving line; a second NMOS transistor having one end which isconnected to the second driving line and the other end which isconnected to the internal node, and configured to be turned on and offin response to the voltage of the first driving line; a third NMOStransistor having one end which is connected to the internal node andthe other end which is applied with the ground voltage, and configuredto be turned on and off in response to an enable signal which isactivated during an activation period of the driving block and isdeactivated during a deactivation period of the driving block; and athird PMOS transistor having one end which is connected to the firstdriving line and the other end which is connected to the second drivingline, and configured to be turned on and off in response to the enablesignal.

In some implementations, the third PMOS transistor may turn off when theenable signal is activated, and turn on when the enable signal isdeactivated.

In some implementations, the first variable resistance element and thesecond variable resistance element may include at least one of a metaloxide and a structure in which a tunnel barrier layer is interposedbetween two ferromagnetic layers.

In some implementations, the electronic device further comprises amicroprocessor which includes: a control unit that is configured toreceive a signal including a command from an outside of themicroprocessor, and performs extracting, decoding of the command, orcontrolling input or output of a signal of microprocessor; and anoperation unit configured to perform an operation based on a result thatthe control unit decodes the command; and a memory unit configured tostore data for performing the operation, data corresponding to a resultof performing the operation, or an address of data for which theoperation is performed, wherein the semiconductor memory unit thatincludes the variable resistance element is part of the memory unit inthe microprocessor.

In some implementations, the electronic device further comprises aprocessor which includes: a core unit configured to perform, based on acommand inputted from an outside of the processor, an operationcorresponding to the command, by using data; a cache memory unitconfigured to store data for performing the operation, datacorresponding to a result of performing the operation, or an address ofdata for which the operation is performed; and a bus interface connectedbetween the core unit and the cache memory unit, and configured totransmit data between the core unit and the cache memory unit, whereinthe semiconductor memory unit that includes the variable resistanceelement is part of the cache memory unit in the processor.

In some implementations, the electronic device further comprises aprocessing system which includes: a processor configured to decode acommand received by the processor and control an operation forinformation based on a result of decoding the command; an auxiliarymemory device configured to store a program for decoding the command andthe information; a main memory device configured to call and store theprogram and the information from the auxiliary memory device such thatthe processor can perform the operation using the program and theinformation when executing the program; and an interface deviceconfigured to perform communication between the processor, the auxiliarymemory device or the main memory device and the outside, wherein thesemiconductor memory unit that includes the variable resistance elementis part of the auxiliary memory device or the main memory device in theprocessing system.

In some implementations, the electronic device further comprises a datastorage system which includes: a storage device configured to store dataand conserve stored data regardless of power supply; a controllerconfigured to control input and output of data to and from the storagedevice according to a command inputted form an outside; a temporarystorage device configured to temporarily store data exchanged betweenthe storage device and the outside; and an interface configured toperform communication between at least one of the storage device, thecontroller and the temporary storage device and the outside, wherein thesemiconductor memory unit that includes the variable resistance elementis part of the storage device or the temporary storage device in thedata storage system.

In some implementations, the electronic device may further include amemory system which includes a memory configured to store data andconserve stored data regardless of power supply; a memory controllerconfigured to control input and output of data to and from the memoryaccording to a command inputted form an outside; a buffer memoryconfigured to buffer data exchanged between the memory and the outside;and an interface configured to perform communication between at leastone of the memory, the memory controller and the buffer memory and theoutside, wherein the semiconductor memory unit that includes thevariable resistance element is part of the memory or the buffer memoryin the memory system.

In another aspect, there is provided a method of operating an electronicdevice including a semiconductor memory unit. The method may include:configuring the semiconductor memory unit to include cell arrays withstorage cells each storage cell including a first or second data bitvalue and including first and second variable resistance elements havinga first resistance value and a second resistance value and a drivingunit connected to a corresponding storage cell, wherein resistancevalues of the first and the second variable resistance elements aredifferent from each other when storing a particular data bit valuetherein and are switched between the first resistance value and thesecond resistance value depending on directions of currents flowingtherethrough; performing a read operation at a storage cell by operatingthe driving unit connected to the storage cell to latch the first or thesecond data bit value stored in the storage cell based on resistancevalues of the first and second variable resistance elements; andperforming a write operation at a storage cell by controlling directionsof currents flowing through the first and second variable resistanceelements of the storage cell, respectively, such that the first orsecond data bit value is written into the storage cell.

In some implementations, the driving units may be disposed on differentsides of a corresponding cell array such that storage cells of thecorresponding cell array are connected with the driving units ondifferent sides of the corresponding cell array.

In some implementations, the driving units may be disposed between twocell arrays such that storage cells of the two cell arrays are connectedto the same driving units.

Those and other aspects of the disclosed technology and theirimplementations and variations are described in greater detail in thedrawings, the description and the claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram showing an example of a magnetic tunnel junction(MTJ) element as one of structures in which a tunneling barrier layer isinterposed between two ferromagnetic layers.

FIGS. 2A and 2B are views explaining an example of an operation forstoring data in a variable resistance element.

FIG. 3 is an exemplary configuration diagram of a memory circuit ordevice including variable resistance elements.

FIG. 4 is an exemplary configuration diagram of a memory circuit ordevice including storage cells each including two variable resistanceelements.

FIG. 5A is a diagram explaining an example of a read operation of thememory device shown in FIG. 4.

FIG. 5B is a diagram explaining an example of a write operation of thememory device shown in FIG. 4.

FIG. 6 is an exemplary configuration diagram of a memory circuit or adevice including storage cells each including two variable resistanceelements.

FIG. 7 is an exemplary configuration diagram of a memory circuit or adevice including storage cells each including two variable resistanceelements.

FIG. 8 is a diagram illustrating a configuration in which a plurality ofcell arrays and a plurality of driving circuits are disposed to have thesame structure as the memory device of FIG. 7.

FIG. 9 is an exemplary configuration diagram of a memory circuit ordevice including storage cells SC each including two variable resistanceelements R1 and R2.

FIG. 10 shows an example of a configuration diagram of a microprocessorimplementing memory circuitry based on the disclosed technology.

FIG. 11 shows an example of a configuration diagram of a processorimplementing memory circuitry based on the disclosed technology.

FIG. 12 shows an example of a configuration diagram of a systemimplementing memory circuitry based on the disclosed technology.

FIG. 13 shows an example of a configuration diagram of a data storagesystem implementing memory circuitry based on the disclosed technology.

FIG. 14 shows an example of a configuration diagram of a memory systemimplementing memory circuitry based on the disclosed technology.

DETAILED DESCRIPTION

Various examples and implementations of the disclosed technology aredescribed below in detail with reference to the accompanying drawings.

The drawings may not be necessarily to scale and in some instances,proportions of at least some of structures in the drawings may have beenexaggerated in order to clearly illustrate certain features of thedescribed examples or implementations. In presenting a specific examplein a drawing or description having two or more layers in a multi-layerstructure, the relative positioning relationship of such layers or thesequence of arranging the layers as shown reflects a particularimplementation for the described or illustrated example and a differentrelative positioning relationship or sequence of arranging the layersmay be possible. In addition, a described or illustrated example of amulti-layer structure may not reflect all layers present in thatparticular multi-layer structure (e.g., one or more additional layersmay be present between two illustrated layers). As a specific example,when a first layer in a described or illustrated multi-layer structureis referred to as being “on” or “over” a second layer or “on” or “over”a substrate, the first layer may be directly formed on the second layeror the substrate but may also represent a structure where one or moreother intermediate layers may exist between the first layer and thesecond layer or the substrate.

A semiconductor device in accordance with embodiments may include avariable resistance element. In the following descriptions, a variableresistance element may exhibits a resistance variable characteristic andmay include a single layer or a multi-layer. For example, a variableresistance element may include substances used in an RRAM, an MRAM, anFRAM, etc., for example, a transition metal compound, a ferroelectric, aferromagnetic, and so on. However, the substances or materials suitablefor implementing the variable resistance element are not limited tothose mentioned above, and other substances or materials may be used fora variable resistance element so that its resistance variablecharacteristic can be switched between different resistance statesaccording to voltages or current applied to both ends thereof.

For example, a variable resistance element may include a metal oxide.For example, the metal oxide may include a transition metal oxide suchas a nickel (Ni) oxide, a titanium (Ti) oxide, a hafnium (Hf) oxide, azirconium (Zr) oxide, a tungsten (W) oxide and a cobalt (Co) oxide or aperovskite-based substance such as STO (SrTiO) and/or PCMO (PrCaMnO).Such a variable resistance element may exhibit a characteristic that itis switched between different resistance states due to creation andextinction of current filaments through behavior of vacancies.

Further, a variable resistance element may include a structure in whicha tunneling barrier layer is interposed between two ferromagneticlayers. The ferromagnetic layers may be formed using a substance such asNiFeCo and CoFe, and the tunneling barrier layer may be formed using asubstance such as Al2O3. The variable resistance element may exhibit acharacteristic that it is switched between different resistance statesaccording to magnetization directions of the ferromagnetic layers. Forexample, in the case where the magnetization directions of the twoferromagnetic layers are parallel to each other, the variable resistanceelement may be in a low resistant state, and, in the case where themagnetization directions of the two ferromagnetic layers areanti-parallel to each other, the variable resistance element may be in ahigh resistant state.

FIG. 1 is a diagram showing an example of a magnetic tunnel junction(MTJ) element as one of structures in which a tunneling barrier layer isinterposed between two ferromagnetic layers.

Referring to FIG. 1, an MTJ element 100 includes a first electrode layer110 as a top electrode, a second electrode layer 120 as a bottomelectrode, a first ferromagnetic layer 112 and a second ferromagneticlayer 122 as a pair of ferromagnetic layers, and a tunneling barrierlayer 130 which is formed between the pair of ferromagnetic layers 112and 122.

The first ferromagnetic layer 112 is a free ferromagnetic layer of whichmagnetization direction may be changed according to a direction ofcurrent applied to the MTJ element 100, and the second ferromagneticlayer 122 is a pinned ferromagnetic layer of which magnetizationdirection is pinned.

The MTJ element 100 is changed in its resistance value according to adirection of current, and records a data bit value of “0” (a low databit value) or “1” (a high data bit value).

FIGS. 2A and 2B are views explaining a principle of storing data in avariable resistance element 210. The variable resistance element 210 maybe the MTJ element 100 described above with reference to FIG. 1. Aselecting or switching element 220 is electrically coupled to one sideof the MTJ 100 in series to turn on or off the electrical path to theMTJ 100 to select or de-select the MTJ 100, respectively. When theselecting element 220 is turned on, the driving circuit for driving theMTJ 100 can direct a current through the MTJ 100 in one of two oppositedirections as illustrated in FIGS. 2A and 2B, respectively. Theselecting element 220 can be implemented by various circuit elements orin various circuit configurations to provide the desired electricalswitching operation in turning on or off the electrical path to the MTJ100 and may be, e.g., a transistor or a diode. In the examplesillustrated, the selecting element 220 is shown as a transistor.

FIG. 2A is a diagram explaining an example of an operation for recordinga low data bit value in the variable resistance element 210. In order toselect the variable resistance element 210 in which data is to bestored, a word line 230 that is designated to a variable resistanceelement is coupled to the corresponding selecting element 220 by, e.g.,being connected to the gate of a transistor as the selecting element220. As shown in FIG. 2A, the voltage of the word line 230 may beenabled to turn on the transistor 220. As current flows from one end 251to the other end 252 (in the direction indicated by the arrow), that is,from the first electrode layer 110 as a top electrode to the secondelectrode layer 120 as a bottom electrode in the MTJ element 100 shownin FIG. 1, the magnetization direction of the first ferromagnetic layer112 functioning as a free ferromagnetic layer and the magnetizationdirection of the second ferromagnetic layer 122 functioning as a pinnedferromagnetic layer become parallel to each other. Under this condition,the variable resistance element 210 is in a low resistance state. Whenthe variable resistance element 210 is in the low resistance state, itis defined that a ‘low’ data bit value “0” is stored in the variableresistance element 210.

FIG. 2B is a diagram explaining a principle of recording a high data bitvalue “1” in the variable resistance element 210. In a similar manner,the word line 230 connected to the variable resistance element 210 isactivated to turn on the transistor 220. As current flows from the otherend 252 to one end 251 (in the direction indicated by the arrow), thatis, from the second electrode layer 120 to the first electrode layer 110in the MTJ element 100 shown in FIG. 1, the magnetization direction ofthe first ferromagnetic layer 112 and the magnetization direction of thesecond ferromagnetic layer 122 become anti-parallel to each other. Underthis condition, the variable resistance element 210 is in a highresistance state. When the variable resistance element 210 is in thehigh resistance state, it is defined that a ‘high’ data bit value “1” isstored in the variable resistance element 210.

FIG. 3 is an exemplary configuration diagram of a memory circuit ordevice including variable resistance elements.

As shown in FIG. 3, a memory device may include a column COL, areference resistance element REF_R, and an access control block 310. Thecolumn COL may include a plurality of storage cells SC.

The column COL may include a bit line BL, a source line SL, and theplurality of storage cells SC which are connected between the bit lineBL and the source line SL. Each storage cell SC may include a variableresistance element R of which resistance value is changed in response toswitching current flowing through both ends thereof, and a selectionelement T which is connected to one end of the variable resistanceelement R and is turned on when a corresponding word line WL isactivated. The bit line BL and the source line SL may be connected tothe access control block 310.

The variable resistance element R may have a first state in which it hasa first resistance value and a second state in which it has a secondresistance value higher than the first resistance value. The first statemay correspond to the low resistance state described above, and thesecond state may correspond to the high resistance state describedabove. The first state of the variable resistance element R may bedefined as a state in which a low data bit value “0” is stored, and thesecond state of the variable resistance element R may be defined as astate in which the high data bit value “1” is stored. Alternatively, thefirst state of the variable resistance element R may be defined as astate in which the high data bit value “1” is stored, and the secondstate of the variable resistance element R may be defined as a state inwhich the low data bit value “0” is stored.

The reference resistance element REF_R may have a resistance valuebetween the first resistance value and the second resistance value ofthe variable resistance element R, and may be connected with the accesscontrol block 310 through a connection element RT (e.g., a transistor asshown) which is turned on or off in response to a read enable signalRDEN which is activated in a read operation.

The access control block 310 may flow a switching current in a directiondetermined by data I_DATA to be written in a selected storage cell SC,when a write command WT is activated. For example, the access controlblock 310 may cause the switching current to flow from the bit line BLto the source line SL through a selected storage cell SC, when the lowdata bit value “0” is written or stored, and may cause the switchingcurrent to flow from the source line SL to the bit line BL through aselected storage cell SC, when the high data bit value “1” is written orstored.

The access control block 310 may compare the resistance value of thevariable resistance element R of a selected storage cell SC and theresistance value of the reference resistance element REF_R, read thedata stored in the selected storage cell SC, and output data O_DATA,when a read command RD is activated. For example, if the low resistancestate is a state in which the low data bit value “0” is stored and thehigh resistance state is a state in which the high data bit value “1” isstored, the access control block 310 may output the low data bit value“0” as the output data O_DATA when the resistance value of the variableresistance element R is smaller than the resistance value of thereference resistance element REF_R, and may output the high data bitvalue “1” as the output data O_DATA when the resistance value of thevariable resistance element R is greater than the resistance value ofthe reference resistance element REF_R.

A read margin may be set to correspond to one half of the differencebetween the first resistance value and the second resistance value. Asthe read margin decreases, the number of errors may increase or readerrors may be more likely to occur to cause degradation of thereliability and performance of the memory circuit or device.Furthermore, as the read margin decreases, a sufficient amount of timemay be required for reading data in order to decrease the number oferrors, and accordingly, a read speed may undesirably decrease.

FIG. 4 is an exemplary configuration diagram of a memory circuit ordevice including storage cells SC each including two variable resistanceelements R1 and R2.

As shown in FIG. 4, a memory device may include one or more columns410_0 to 410_M, a word line control block 420, a column select signalgeneration block 430, and a data line DATA and a data line bar DATAB.

The memory device will be described below with reference to FIG. 4.

Each of one or more columns 410_0 to 410_M may include a plurality ofstorage cells SC, a bit line BL and a bit line bar BLB, a source lineSL, first and second driving lines DRV_L1 and DRV_L2, and acorresponding driving blocks 411_0 to 411_M. The columns 410_0 to 410_Mmay be arranged in various manners in relation to the correspondingdriving blocks 411_0 to 411_M. For example, all storage cells SC of eachcolumn 410_0 to 410_M may be disposed on one side of the correspondingdriving blocks 411_0 to 411_M. Alternatively, some of storage cells SCof each columns 410_0 to 410_M may be disposed on one side of each ofthe driving blocks 411_0 to 411_M and the remaining storage cells SC ofeach columns 410_0 to 410_M may be disposed on the other side of each ofthe driving blocks 411_0 to 411_M. FIG. 4 shows an exemplaryconfiguration that all storage cells SC of each columns 410_0 to 410_Mare disposed on one side (for example, the upper side) of thecorresponding driving blocks 411_0 to 411_M.

The plurality of respective columns 410_0 to 410_M may include firstcolumn selection elements YW1<0:M> and second column selection elementsYW2<0:M>. Each of the first column selection elements YW1<0:M> each ofwhich is connected between the first driving line DRV_L1 and the dataline DATA and is turned on when a corresponding column is selected. Eachof the second column selection elements YW2<0:M> is connected betweenthe second driving line DRV_L2 and the data line bar DATAB and is turnedon when a corresponding column is selected. The first column selectionelements YW1<0:M> and the second column selection elements YW2<0:M> mayoperate in response to column select signals YI<0:M>, and may be turnedon when the corresponding column select signal are activated.

Each of the plurality of storage cells SC may store 1-bit data value,and may be selected when a corresponding word line among a plurality ofword lines WL0 to WLN is activated. Each of the plurality of storagecells SC may include two variable resistance elements R1 and R2 and twoselection elements S1 and S2. In each storage cell, the first variableresistance element R1 may have a first resistance value when a firstvalue is stored in the storage cell SC, and may have a second resistancevalue when a second value is stored in the storage cell SC. The secondvariable resistance element R2 may have the second resistance value whenthe first value is stored in the storage cell SC, and may have the firstresistance value when the second value is stored in the storage cell SC.The first value and the second value may correspond to the high data bitvalue and the low data bit value, respectively, or may correspond to lowdata bit value and and the high data bit value, respectively. In thedescriptions below, it is assumed that the first value and the secondvalue correspond to the low data bit value and and the high data bitvalue, respectively.

One end A1 of the first variable resistance element R1 may be connectedto the bit line BL, and the other end B1 of the first variableresistance element R1 may be connected to the source line SL through thefirst selection element S1. One end A2 of the second variable resistanceelement R2 may be connected to the bit line bar BLB, and the other endB2 of the second variable resistance element R2 may be connected to thesource line SL through the second selection element S2. The first andsecond selection elements S1 and S2 may be turned on or off in responseto the voltage of a corresponding word line WL.

The first and second variable resistance elements R1 and R2 may beswitched between the first resistance value and the second resistancevalue according to a direction of the switching current flowingtherethrough. For example, the resistance values of the first and secondvariable resistance elements R1 and R2 may be switched to the firstresistance value when the switching current flows along the directionfrom B1 to A1 and from B2 to A2, respectively. The resistance values ofthe first and second variable resistance elements R1 and R2 may beswitched to the second resistance value when the switching current flowsalong the direction from A1 to B1 and A2 to B2, respectively

The word line control block 420 may activate a word line based on wordline selection information SELW<0:A>, among the plurality of word linesWL0 to WLN, in response to an activation signal ACT. The word linecontrol block 420 may provide a voltage to activate a corresponding wordline for turning on the selection elements S1 and S2. The word linecontrol block 420 may deactivate an activated word line in response to adeactivation signal DACT.

The column select signal generation block 430 may activate a columnselect signal based on column selection information SELC<0:B>, among theplurality of column select signals YI<0:M>, for a predefined period inresponse to a read command RD or a write command WT.

During a write operation, if a corresponding column is selected, adriving block 411_0 to 411_M may latch the data on the data line DATAand the data line bar DATAB and drive the first driving line DRV_L1 andthe second driving line DRV_L2. During a read operation, the drivingblock 411_0 to 411_M may drive the first driving line DRV_L1 and thesecond driving line DRV_L2 with voltages corresponding to currentflowing through the bit line BL and the bit line bar BLB. Also, whendeactivated, the driving block 411_0 to 411_M may precharge the firstdriving line DRV_L1 and the second driving line DRV_L2 with apredetermined voltage. For example, in FIG. 4, the first driving lineDRV_L1 and the second driving line DRV_L2 are precharged with a powersupply voltage VDD.

Each of the driving blocks 411_0 to 411_M may include a first PMOStransistor P1 which has one end connected to the first driving lineDRV_L1 and the other end applied with the power supply voltage VDD andis turned on or off in response to the voltage of the second drivingline DRV_L2, a second PMOS transistor P2 which has one end connected tothe second driving line DRV_L2 and the other end applied with the powersupply voltage VDD and is turned on or off in response to the voltage ofthe first driving line DRV_L1, a first NMOS transistor N1 which has oneend connected to the first driving line DRV_L1 and the other endconnected to an internal node NO and is turned on or off in response tothe voltage of the second driving line DRV_L2, a second NMOS transistorN2 which has one end connected to the second driving line DRV_L2 and theother end connected to the internal node NO and is turned on or off inresponse to the voltage of the first driving line DRV_L1, and a thirdNMOS transistor N3 which has one end connected to the internal node NOand the other end applied with a ground voltage VSS and is turned on oroff in response to an enable signal SEN activated during the activationperiod of each of the driving blocks 411_0 to 411_M and deactivatedduring the deactivation period of each of the driving blocks 411_0 to411_M.

The first driving line DRV_L1 may be connected with the bit line BLthrough a first write connection element WC1 and a first sourcingconnection element SO1, and the second driving line DRV_L2 may beconnected with the bit line bar BLB through a second write connectionelement WC2 and a second sourcing connection element SO2. The sourceline SL may be connected with the terminal of the ground voltage VSSthrough a sinking connection element SI.

The first and second sourcing connection elements SO1 and SO2 may beturned on or off in response to a clamp signal VCLAMP which is activatedfor a predetermined period after a word line is activated. The sinkingconnection element SI may be turned on or off in response to a readsinking signal RDSINK which is activated for a preselected period aftera word line is activated. The first and second write connection elementsWC1 and WC2 may be turned on or off in response to each of write enablesignals WTEN<0:M> which is activated for a preset period during thewrite operation when a corresponding column is selected.

Hereafter, the read and write operations of the memory device will bedescribed with reference to FIGS. 5A and 5B.

FIG. 5A is a diagram explaining the read operation of the memory deviceshown in FIG. 4.

With reference to FIG. 5A, descriptions will be made assuming that thefirst column 410_0 is selected and the data bit value of the storagecell SC connected to the first word line WL0 is to be read. For the sakeof simplicity in illustration, in a configuration diagram A, the storagecell SC connected to the first word line WL0 of the first column 410_0and necessary components for the read operation are mainly shown andother elements are omitted. A waveform diagram B illustrates thewaveforms of the signals applied to respective component elements of thememory device in the read operation.

Since the enable signal SEN is in a deactivated state before the readoperation is started, the driving block 411_0 may be in a deactivatedstate (the third NMOS transistor N3 is turned off), and the first andsecond driving lines DRV_L1 and DRV_L2 may be in a state in which theyare precharged with the power supply voltage VDD.

If the activation signal ACT is activated, the word line WL0corresponding to the word line selection information SELW<0:A> may beactivated, and the first and second selection elements S1 and S2corresponding to the word line WL0 may be turned on. Thereafter, as theclamp signal VCLAMP is activated for the predetermined period, the firstand second sourcing connection elements SO1 and SO2 may be turned on. Asthe read sinking signal RDSINK is activated for the preselected period,the sinking connection element SI may be turned on. First read currentIR1 may flow through a first path PATH1 due to the potential differencebetween the first driving line DRV_L1 and the source line SL, and secondread current IR2 may flow through a second path PATH2 due to thepotential difference between the second driving line DRV_L2 and thesource line SL.

The magnitude of the first read current IR1 may be inverselyproportional to the resistance value of the first variable resistanceelement R1, and the magnitude of the second read current IR2 may beinversely proportional to the resistance value of the second variableresistance element R2. Since the resistance value of the first variableresistance element R1 and the resistance value of the second variableresistance element R2 are different, a difference between the magnitudesof the first read current IR1 and the second read current IR2 causes thevoltage levels of the first driving line DRV_L1 and the second drivingline DRV_L2 to be different from each other. If the enable signal SEN isactivated, the third NMOS transistor N3 may be turned on, and thedriving block 411_0 may be activated. The activated driving block 411_0may drive the first driving line DRV_L1 and the second driving lineDRV_L2 according to the voltage difference between the first drivingline DRV_L1 and the second driving line DRV_L2, and may latch the datastored in the storage cell SC.

If the first and second variable resistance elements R1 and R2respectively have the first resistance value and the second resistancevalue, because the first read current IR1 is greater than the secondread current IR2, the voltage of the first driving line DRV_L1 becomeslower than the voltage of the second driving line DRV_L2. The activateddriving block 411_0 may drive the first driving line DRV_L1 to theground voltage VSS and the second driving line DRV_L2 to the powersupply voltage VDD, and may latch the value (the first value) stored inthe selected storage cell SC. If the first and second variableresistance elements R1 and R2 respectively have the second resistancevalue and the first resistance value, the first and second driving linesDRV_L1 and DRV_L2 may be driven in an opposite way to the abovedescription, and the driving block 411_0 may latch the second value.

If the read command RD is activated, after the data of the selectedstorage cell SC is latched by the driving block 411_0, the first columnselect signal YI<0> corresponding to the column selection informationSELC<0:B> may be activated. The first and second column selectionelements YW1<0> and YW2<0> of the first column 410_0 may be turned on inresponse to the first column select signal YI<0>, and the data latchedby the driving block 411_0 may be outputted to the data line DATA andthe data line bar DATAB.

For reference, in the read operation, if the magnitudes of the readcurrent IR1 and IR2 are too large, the resistance values of the variableresistance elements R1 and R2 may be switched. Accordingly, themagnitudes of the read current IR1 and IR2 should be limited to certainmagnitudes such that the resistance values of the variable resistanceelements R1 and R2 are not switched, and the activation level of theclamp signal VCLAMP may be set to a predetermined level. The magnitudesof the read current IR1 and IR2 may be decreased by lowering theactivation level of the clamp signal VCLAMP. Conversely, the magnitudesof the read current IR1 and IR2 may be increased by raising theactivation level of the clamp signal VCLAMP.

FIG. 5B is a diagram explaining the write operation of the memory deviceshown in FIG. 4.

With reference to FIG. 5B, descriptions will be made assuming that thefirst column 410_0 is selected and the data of the storage cell SCconnected to the first word line WL0 is to be written. For the sake ofsimplicity in illustration, in configuration diagrams A1 and A2, thestorage cell SC connected to the first word line WL0 of the first column410_0 and the necessary component elements for the writing operation aremainly shown and other component elements are omitted. A waveformdiagram B illustrates the waveforms of the signals applied to respectivecomponent elements of the memory device during the write operation.

Since the enable signal SEN is in a deactivated state before the writeoperation is started, the driving block 411_0 may be in a deactivatedstate (the third NMOS transistor N3 is turned off), and the first andsecond driving lines DRV_L1 and DRV_L2 may be in a state in which theyare precharged with the power supply voltage VDD.

If the activation signal ACT is activated, the word line WL0 may beactivated based on the word line selection information SELW<0:A>, andthe first and second selection elements S1 and S2 that are coupled tothe word line WL0 may be turned on. If the enable signal SEN isactivated, the third NMOS transistor N3 may be turned on, and thedriving block 411_0 may be activated.

If the write command WT is activated, the driving block 411_0 isactivated and then, the first column select signal YI<0> correspondingto the column selection information SELC<0:B> may be activated. Thefirst and second column selection elements YW1<0> and YW2<0> of thefirst column 410_0 may be turned on in response to the first columnselect signal YI<0>, and the data of the data line and the data line barDATA and DATAB may be transferred to the first and second driving linesDRV_L1 and DRV_L2 and be latched by the driving block 411_0.

After the driving block 411_0 latches the data of the data line DATA andthe data line bar DATAB, if the write enable signal WTEN<0> isactivated, the first and second write connection elements WC1 and WC2may be turned on, and write current IW may flow through the first andsecond variable resistance elements R1 and R2. A direction in which thewrite current IW flows may be changed according to the value of the datatransferred through the data line DATA and the data line bar DATAB.

The following explains an example for how the low data bit value “0”(the first value) is written (Case A1).

The driving block 411_0 may drive the first driving line DRV_L1 to theground voltage VSS and the second driving line DRV_L2 to the powersupply voltage VDD. If the write enable signal WTEN<0> is activated, thefirst driving line DRV_L1 and the bit line BL may be connected, and thesecond driving line DRV_L2 and the bit line bar BLB may be connected.Therefore, the write current IW may flow from the first driving lineDRV_L1 to the second driving line DRV_L2. Accordingly, the resistancevalues of the first and second variable resistance elements R1 and R2may be switched to the first resistance value and the second resistancevalue, respectively.

The following explains an example for how the high data bit value “1”(the second value) is written (Case A2).

The driving block 411_0 may drive the first driving line DRV_L1 to thepower supply voltage VDD and the second driving line DRV_L2 to theground voltage VS S. If the write enable signal WTEN<0> is activated,the first driving line DRV_L1 and the bit line BL may be connected, andthe second driving line DRV_L2 and the bit line bar BLB may beconnected. Therefore, the write current IW may flow from the seconddriving line DRV_L2 to the first driving line DRV_L1. Accordingly, theresistance values of the first and second variable resistance elementsR1 and R2 may be switched to the second resistance value and the firstresistance value, respectively.

FIG. 6 is an exemplary configuration diagram of a memory circuit ordevice including storage cells SC each including two variable resistanceelements R1 and R2.

As shown in FIG. 6, a memory device may include one or more columns410_0 to 410_M, a word line control block 420, a column select signalgeneration block 430, and a data line DATA and a data line bar DATAB.

The memory device will be described below with reference to FIG. 6.

FIG. 6 shows that, in each of the columns 410_0 to 410_M, partialstorage cells SC are disposed on one side D1 of each of the drivingblocks 411_0 to 411_M and the remaining storage cells SC are disposed onthe other side D2 of each of the driving blocks 411_0 to 411_M. In FIG.6, the storage cells SC disposed on the one side D1 may be connected toa first source line SL1, and the storage cells SC disposed on the otherside D2 may be connected to a second source line SL2.

The first source line SL1 may be connected with the terminal of a groundvoltage VSS through a first sinking connection element SI1, and thesecond source line SL2 may be connected with the terminal of the groundvoltage VSS through a second sinking connection element SI2. The firstsinking connection element SI1 may be turned on or off in response to afirst read sinking signal RDSINK1 which is activated for a preselectedperiod after a word line is activated, and the second sinking connectionelement SI2 may be turned on or off in response to a second read sinkingsignal RDSINK2 which is activated for the preselected period after aword line is activated.

In the memory device of FIG. 6, in a read operation, the first readsinking signal RDSINK1 may be activated in the case where the storagecell SC disposed on the one side D1 of each of the driving blocks 411_0to 411_M is selected, and the second read sinking signal RDSINK2 may beactivated in the case where the storage cell SC disposed on the otherside D2 of each of the driving blocks 411_0 to 411_M is selected. Exceptthis, the operation of the memory device shown in FIG. 6 may be the sameas the operation of the memory device shown in FIG. 4 described abovewith reference to FIGS. 4 and 5.

FIG. 7 is an exemplary configuration diagram of a memory circuit ordevice including storage cells SC each including two variable resistanceelements R1 and R2.

As shown in FIG. 7, a memory device may include a cell array 710, a wordline control block 720, a column select signal generation block 730, oneor more first driving blocks 740_0 to 740_K, one or more second drivingblocks 750_0 to 750_L, a first data line DATA1 and a first data line barDATAB1, and a second data line DATA2 and a second data line bar DATAB2.

The memory device will be described below with reference to FIG. 7.

The memory devices shown in FIGS. 4 and 6 include cell arrays includingthe respective driving blocks disposed in one row. For example, FIG. 4illustrates cell arrays that are arranged on the same side of thedriving blocks 411_0 to 411_M which are disposed in one row, and FIG. 6shows ceel arrays that are arranged on different sides of the drivingblocks 411_0 to 411_M which are disposed in one row.

In the memory device shown in FIG. 7, driving blocks may be disposed indifferent rows. For example, a cell array 710 includes storage cells SCthat are connected to first driving blocks 740_0 to 740_k and storagecells SC that are connected to the second driving blocks 750_0 to 750_L.One or more first driving blocks 740_0 to 740_K may be disposed in afirst row ROW1, and one or more second driving blocks 750_0 to 750_L maybe disposed in a second row ROW2.

The first driving blocks 740_0 to 740_K may be connected with the firstdata line DATA1 and the first data line bar DATAB1 through correspondingfirst and second column selection elements YW1 and YW2, and the seconddriving blocks 750_0 to 750_L may be connected with the second data lineDATA2 and the second data line bar DATAB2 through corresponding firstand second column selection elements YW1 and YW2. The respective firstand second column selection elements YW1 and YW2 may be turned on when acorresponding column select signal among pluralities of column selectsignals YI1<0:K> and YI2<0:L> is activated.

In the case where a selected storage cell SC corresponds to the firstdriving blocks 740_0 to 740_K, the first data line and the first dataline bar DATA1 and DATAB1 may transfer the data read from the selectedstorage cell SC or may transfer data to write in the selected storagecell SC. In the case where a selected storage cell SC corresponds to thesecond driving blocks 750_0 to 750_L, the second data line DATA2 and thesecond data line bar DATAB2 may transfer the data read from the selectedstorage cell SC or may transfer data to write in the selected storagecell SC.

The cell array 710 may include storage cells SC which are connected withthe first driving blocks 740_0 to 740_K and storage cells SC which areconnected with the second driving blocks 750_0 to 750_L. The storagecells SC connected with the first driving blocks 740_0 to 740_K aredisposed on one sides D2 of the first driving blocks 740_0 to 740_K. Thestorage cells SC connected with the second driving blocks 750_0 to 750_Lare disposed on the one sides D1 of the second driving blocks 750_0 to750_L. The respective storage cells SC may be connected between bitlines and bit line bars BL and BLB. The driving blocks 740_0 to 740_Kand 750_0 to 750_L may be connected with first data lines DATA1 orsecond data lines DATA2 through corresponding bit lines BL, and may beconnected with first data line bars DATAB1 or second data line barsDATAB2 through corresponding bit line bars BLB. The configurations ofthe respective driving blocks 740_0 to 740_K and 750_0 to 750_L and theread and write operations of the storage cells SC connected to therespective driving blocks 740_0 to 740_K and 750_0 to 750_L are the sameas those described above with reference to FIG. 6.

As shown in FIGS. 4 to 7, the cell array of the memory device and itsperipheral circuits may be configured in various ways.

FIGS. 4, 6 and 7 show that, in each storage cell SC, one end of thefirst variable resistance element R1 is connected to the bit line BL,the first selection element S1 is connected between the other end of thefirst variable resistance element R1 and the source line SL, SL1 or SL2,one end of the second variable resistance element R2 is connected to thebit line bar BLB, and the second selection element S2 is connectedbetween the other end of the second variable resistance element R2 andthe source line SL, SL1 or SL2. The positions of the first variableresistance element R1 and the first selection element S1 and theconnection configurations such as connection order of the secondvariable resistance element R2 and the second selection element S2 maybe changed according to a design. For example, it may be envisaged thatthe first selection element S1 is connected to the bit line BL, thefirst variable resistance element R1 is connected between the firstselection element S1 and the source line SL, SL1 or SL2, the secondvariable resistance element R2 is connected to the bit line bar BLB, andthe second selection element S2 is connected between the second variableresistance element R2 and the source line SL, SL1 or SL2. Alternatively,it may be envisaged that the first variable resistance element R1 isconnected to the bit line BL, the first selection element S1 isconnected between the first variable resistance element R1 and thesource line SL, SL1 or SL2, the second selection element S2 is connectedto the bit line bar BLB, and the second variable resistance element R2is connected between the second selection element S2 and the source lineSL, SL1 or SL2. Finally, it may be envisaged that the first selectionelement S1 is connected to the bit line BL, the first variableresistance element R1 is connected between the first selection elementS1 and the source line SL, SL1 or SL2, the second selection element S2is connected to the bit line bar BLB, and the second variable resistanceelement R2 is connected between the second selection element S2 and thesource line SL, SL1 or SL2. Also, the connection orders of the variableresistance elements R1 and R2 and the selection elements S1 and S2 maybe varied in the respective storage cells SC.

FIG. 8 is a diagram illustrating a configuration in which a plurality ofcell arrays CA and a plurality of driving circuits DRV are disposed inthe same manner as the memory device of FIG. 7.

In FIG. 8, the cell arrays CA and the driving circuits DRV are simplyillustrated by blocks, to show a pattern in which the plurality of cellarrays CA and the plurality of driving circuits DRV are disposed.Moreover, since FIG. 8 is provided for showing the connectionrelationship between the cell arrays CA and the driving circuits DRV,component elements such as the word lines WL, the word line controlblock 720, the column select signal generation block 730 and the columnselection elements YW1 and YW2 are omitted. For reference, each drivingcircuit DRV may include a driving block and first and second drivinglines as described above.

As shown in FIG. 8, the driving circuits DRV may be connected withcorresponding storage cells (not shown) through bit lines and bit linebars BL and BLB, and may be connected with corresponding data lines DATAand data line bars DATAB.

For example, each of the respective driving circuits DRV may beconnected with the storage cells of an adjacent cell array CA, through abit line BL and a bit line bar BLB. When a corresponding driving circuitDRV is selected, a bit line BL and a bit line bar BLB may be connectedwith a data line DATA and a data line bar DATAB. The storage cellsincluded in one cell array CA may be connected with a driving circuitDRV which is disposed on one side D1 or the other side D2 of thecorresponding cell array CA.

As is apparent from the above descriptions, in the electronic deviceaccording to the implementations, since a storage cell includes twovariable resistance elements and thus a difference in the resistancevalues of the storage cell according to the data stored thereinincreases, the margins and speeds of read and write operations of theelectronic device may be increased.

Further, in the electronic device according to the implementations,since the degree of integration of storage cells each including twovariable resistance elements is increased, the size of the electronicdevice may be decreased.

FIG. 9 is an exemplary configuration diagram of a memory circuit ordevice including storage cells SC each including two variable resistanceelements R1 and R2. The memory circuit or device of FIG. 9 may includedriving units 911_0-911_M which are different from the memory circuit ordevice of FIG. 4.

During a write operation, if a corresponding column is selected, adriving block 911_0 to 911_M may latch the data on the data line DATAand the data line bar DATAB and drive the first driving line DRV_L1 andthe second driving line DRV_L2. During a read operation, the drivingblock 911_0 to 911_M may drive the first driving line DRV_L1 and thesecond driving line DRV_L2 with voltages corresponding to currentflowing through the bit line BL and the bit line bar BLB. Also, whendeactivated, the driving block 911_0 to 911_M may precharge the firstdriving line DRV_L1 and the second driving line DRV_L2 with apredetermined voltage. For example, in FIG. 4, the first driving lineDRV_L1 and the second driving line DRV_L2 are precharged with a powersupply voltage VDD. During a precharge period, the driving block 911_0to 911_M may drive both ends with same voltage level. The prechargeperiod is a period where the enable signal SEN is deactivated.

Each of the driving blocks 911_0 to 911_M may further include a thirdPMOS transistor P3 having one end which is connected to the firstdriving line DRV_L1 and the other end which is connected to the seconddriving line DRV_L2, and configured to be turned on and off in responseto the enable signal SEN. The third PMOS transistor P3 turns off whenthe enable signal SEN is activated, and turns on when the enable signalSEN is deactivated. When the third transistor turns on, the both ends ofthe driving unit electrically connected. Therefore, voltage levels ofthe both ends of the driving unit become equal, and the first and seconddriving line DRV_L1, DRV_L2 are driven with same voltage level.

The driving units of FIG. 6 and FIG. 7 may include components which aresame components of driving unit of FIG. 9.

The above and other memory circuits or semiconductor devices based onthe disclosed technology can be used in a range of devices or systems.FIGS. 10-14 provide some examples of devices or systems that canimplement the memory circuits disclosed herein.

FIG. 10 shows an example of a configuration diagram of a microprocessorbased on another implementation of the disclosed technology.

Referring to FIG. 10, a microprocessor 1000 may perform tasks forcontrolling and tuning a series of processes of receiving data fromvarious external devices, processing the data, and outputting processingresults to external devices. The microprocessor 1000 may include amemory unit 1010, an operation unit 1020, a control unit 1030, and soon. The microprocessor 1000 may be various data processing units such asa central processing unit (CPU), a graphic processing unit (GPU), adigital signal processor (DSP) and an application processor (AP).

The memory unit 1010 is a part which stores data in the microprocessor1000, as a processor register, register or the like. The memory unit1010 may include a data register, an address register, a floating pointregister and so on. Besides, the memory unit 1010 may include variousregisters. The memory unit 1010 may perform the function of temporarilystoring data for which operations are to be performed by the operationunit 1020, result data of performing the operations and an address wheredata for performing of the operations are stored.

The memory unit 1010 may include one or more of the above-describedsemiconductor devices in accordance with the implementations. Forexample, the memory unit 1010 may include: one or more columns; and adata line and a data line bar connected with a column selected among theone or more columns. Each of the one or more columns may include aplurality of storage cells each configured to store 1-bit data, eachstorage cell including a first variable resistance element which has afirst resistance value when a first value is stored therein and a secondresistance value when a second value is stored therein and a secondvariable resistance element which has the second resistance value whenthe first value is stored therein and the first resistance value whenthe second value is stored therein; a bit line connected to one end ofthe first variable resistance element; a bit line bar connected to oneend of the second variable resistance element; a source line connectedto the other ends of the first and second variable resistance elements;and a driving block configured to latch data of the data line and thedata line bar when a corresponding column is selected, the driving blockconfigured to, in a write operation, drive the bit line and the bit linebar with a first voltage and a second voltage based on a value of thelatched data, and the driving block further configured to, in a readoperation, latch data corresponding to a current flowing through the bitline and the bit line bar. Through this, a read margin of the memoryunit 1010 may be improved, speed of read and write operation of thememory unit may be increased and current and power consumption of thememory unit 1010 may be decreased. Consequently, operation speed andstability of the microprocessor 1000 may be improved.

The operation unit 1020 may perform four arithmetical operations orlogical operations according to results that the control unit 1030decodes commands. The operation unit 1020 may include at least onearithmetic logic unit (ALU) and so on.

The control unit 1030 may receive signals from the memory unit 1010, theoperation unit 1020 and an external device of the microprocessor 1000,perform extraction, decoding of commands and controlling input andoutput of signals of the microprocessor, and execute processingrepresented by programs.

The microprocessor 1000 according to the present implementation mayadditionally include a cache memory unit 1040 which can temporarilystore data to be inputted from an external device other than the memoryunit 1010 or to be outputted to an external device. In this case, thecache memory unit 1040 may exchange data with the memory unit 1010, theoperation unit 1020 and the control unit 1030 through a bus interface1050.

FIG. 11 is a configuration diagram of a processor based on anotherimplementation of the disclosed technology.

Referring to FIG. 11, a processor 1100 may improve performance andrealize multi-functionality by including various functions other thanthose of a microprocessor which performs tasks for controlling andtuning a series of processes of receiving data from various externaldevices, processing the data, and outputting processing results toexternal devices. The processor 1100 may include a core unit 1110 whichserves as the microprocessor, a cache memory unit 1120 which serves tostoring data temporarily, and a bus interface 1130 for transferring databetween internal and external devices. The processor 1100 may includevarious system-on-chips (SoCs) such as a multi-core processor, a graphicprocessing unit (GPU) and an application processor (AP).

The core unit 1110 of the present implementation is a part whichperforms arithmetic logic operations for data inputted from an externaldevice, and may include a memory unit 1111, an operation unit 1112 and acontrol unit 1113.

The memory unit 1111 is a part which stores data in the processor 1100,as a processor register, a register or the like. The memory unit 1111may include a data register, an address register, a floating pointregister and so on. Besides, the memory unit 1111 may include variousregisters. The memory unit 1111 may perform the function of temporarilystoring data for which operations are to be performed by the operationunit 1112, result data of performing the operations and an address wheredata for performing of the operations are stored. The operation unit1112 is a part which performs operations in the processor 1100. Theoperation unit 1112 may perform four arithmetical operations, logicaloperations, according to results that the control unit 1113 decodescommands, or the like. The operation unit 1112 may include at least onearithmetic logic unit (ALU) and so on. The control unit 1113 may receivesignals from the memory unit 1111, the operation unit 1112 and anexternal device of the processor 1100, perform extraction, decoding ofcommands, controlling input and output of signals of processor, andexecute processing represented by programs.

The cache memory unit 1120 is a part which temporarily stores data tocompensate for a difference in data processing speed between the coreunit 1110 operating at a high speed and an external device operating ata low speed. The cache memory unit 1120 may include a primary storageunit 1121, a secondary storage unit 1122 and a tertiary storage unit1123. In general, the cache memory unit 1120 includes the primary andsecondary storage units 1121 and 1122, and may include the tertiarystorage unit 1123 in the case where high storage capacity is required.As the occasion demands, the cache memory unit 1120 may include anincreased number of storage units. That is to say, the number of storageunits which are included in the cache memory unit 1120 may be changedaccording to a design. The speeds at which the primary, secondary andtertiary storage units 1121, 1122 and 1123 store and discriminate datamay be the same or different. In the case where the speeds of therespective storage units 1121, 1122 and 1123 are different, the speed ofthe primary storage unit 1121 may be largest. At least one storage unitof the primary storage unit 1121, the secondary storage unit 1122 andthe tertiary storage unit 1123 of the cache memory unit 1120 may includeone or more of the above-described semiconductor devices in accordancewith the implementations. For example, the cache memory unit 1120 mayinclude: one or more columns; and a data line and a data line barconnected with a column selected among the one or more columns. Each ofthe one or more columns may include a plurality of storage cells eachconfigured to store 1-bit data, each storage cell including a firstvariable resistance element which has a first resistance value when afirst value is stored therein and a second resistance value when asecond value is stored therein and a second variable resistance elementwhich has the second resistance value when the first value is storedtherein and the first resistance value when the second value is storedtherein; a bit line connected to one end of the first variableresistance element; a bit line bar connected to one end of the secondvariable resistance element; a source line connected to the other endsof the first and second variable resistance elements; and a drivingblock configured to latch data of the data line and the data line barwhen a corresponding column is selected, the driving block configuredto, in a write operation, drive the bit line and the bit line bar with afirst voltage and a second voltage based on a value of the latched data,and the driving block further configured to, in a read operation, latchdata corresponding to a current flowing through the bit line and the bitline bar. Through this, a read margin of the cache memory unit 1120 maybe improved, speed of read and write operation of the memory unit may beincreased, and current and power consumption of the cache memory unit1120 may be decreased. Consequently, operation speed and stability ofthe processor 1100 may be improved.

Although it was shown in FIG. 11 that all the primary, secondary andtertiary storage units 1121, 1122 and 1123 are configured inside thecache memory unit 1120, it is to be noted that all the primary,secondary and tertiary storage units 1121, 1122 and 1123 of the cachememory unit 1120 may be configured outside the core unit 1110 and maycompensate for a difference in data processing speed between the coreunit 1110 and the external device. Meanwhile, it is to be noted that theprimary storage unit 1121 of the cache memory unit 1120 may be disposedinside the core unit 1110 and the secondary storage unit 1122 and thetertiary storage unit 1123 may be configured outside the core unit 1110to strengthen the function of compensating for a difference in dataprocessing speed. In another implementation, the primary and secondarystorage units 1121, 1122 may be disposed inside the core units 1110 andtertiary storage units 1123 may be disposed outside core units 1110. Thebus interface 1130 is a part which connects the core unit 1110, thecache memory unit 1120 and external device and allows data to beefficiently transmitted.

The processor 1100 according to the present implementation may include aplurality of core units 1110, and the plurality of core units 1110 mayshare the cache memory unit 1120. The plurality of core units 1110 andthe cache memory unit 1120 may be directly connected or be connectedthrough the bus interface 1130. The plurality of core units 1110 may beconfigured in the same way as the above-described configuration of thecore unit 1110. In the case where the processor 1100 includes theplurality of core unit 1110, the primary storage unit 1121 of the cachememory unit 1120 may be configured in each core unit 1110 incorrespondence to the number of the plurality of core units 1110, andthe secondary storage unit 1122 and the tertiary storage unit 1123 maybe configured outside the plurality of core units 1110 in such a way asto be shared through the bus interface 1130. The processing speed of theprimary storage unit 1121 may be larger than the processing speeds ofthe secondary and tertiary storage unit 1122 and 1123. In anotherimplementation, the primary storage unit 1121 and the secondary storageunit 1122 may be configured in each core unit 1110 in correspondence tothe number of the plurality of core units 1110, and the tertiary storageunit 1123 may be configured outside the plurality of core units 1110 insuch a way as to be shared through the bus interface 1130. The processor1100 according to the present implementation may further include anembedded memory unit 1140 which stores data, a communication module unit1150 which can transmit and receive data to and from an external devicein a wired or wireless manner, a memory control unit 1160 which drivesan external memory device, and a media processing unit 1170 whichprocesses the data prepared in the processor 1100 or the data inputtedfrom an external input device and outputs the processed data to anexternal interface device and so on. Besides, the processor 1100 mayinclude a plurality of various modules and devices. In this case, theplurality of modules which are added may exchange data with the coreunits 1110 and the cache memory unit 1120 and with one another, throughthe bus interface 1130.

The embedded memory unit 1140 may include not only a volatile memory butalso a nonvolatile memory. The volatile memory may include a DRAM(dynamic random access memory), a mobile DRAM, an SRAM (static randomaccess memory) and a memory with similar functions to above mentionedmemories, and so on. The nonvolatile memory may include a ROM (read onlymemory), a NOR flash memory, a NAND flash memory, a phase change randomaccess memory (PRAM), a resistive random access memory (RRAM), a spintransfer torque random access memory (STTRAM), a magnetic random accessmemory (MRAM), and a memory with similar functions.

The communication module unit 1150 may include a module capable of beingconnected with a wired network, a module capable of being connected witha wireless network and both of them. The wired network module mayinclude a local area network (LAN), a universal serial bus (USB), anEthernet, power line communication (PLC) such as various devices whichsend and receive data through transmit lines, and so on. The wirelessnetwork module may include Infrared Data Association (IrDA), codedivision multiple access (CDMA), time division multiple access (TDMA),frequency division multiple access (FDMA), a wireless LAN, Zigbee, aubiquitous sensor network (USN), Bluetooth, radio frequencyidentification (RFID), long term evolution (LTE), near fieldcommunication (NFC), a wireless broadband Internet (Wibro), high speeddownlink packet access (HSDPA), wideband CDMA (WCDMA), ultra wideband(UWB), such as various devices which send and receive data withouttransmit lines, and so on.

The memory control unit 1160 is to administrate and process datatransmitted between the processor 1100 and an external storage deviceoperating according to a different communication standard. The memorycontrol unit 1160 may include various memory controllers, for example,devices which may control IDE (Integrated Device Electronics), SATA(Serial Advanced Technology Attachment), SCSI (Small Computer SystemInterface), RAID (Redundant Array of Independent Disks), an SSD (solidstate disk), eSATA (External SATA), PCMCIA (Personal Computer MemoryCard International Association), a USB (universal serial bus), a securedigital (SD) card, a mini secure digital (mSD) card, a micro securedigital (micro SD) card, a secure digital high capacity (SDHC) card, amemory stick card, a smart media (SM) card, a multimedia card (MMC), anembedded MMC (eMMC), a compact flash (CF) card, and so on.

The media processing unit 1170 may process the data processed in theprocessor 1100 or the data inputted in the forms of image, voice andothers from the external input device and output the data to theexternal interface device. The media processing unit 1170 may include agraphic processing unit (GPU), a digital signal processor (DSP), a highdefinition audio device (HD audio), a high definition multimediainterface (HDMI) controller, and so on.

FIG. 12 is a configuration diagram of a system based on anotherimplementation of the disclosed technology.

Referring to FIG. 12, a system 1200 as an apparatus for processing datamay perform input, processing, output, communication, storage, etc. toconduct a series of manipulations for data. The system 1200 may includea processor 1210, a main memory device 1220, an auxiliary memory device1230, an interface device 1240, and so on. The system 1200 of thepresent implementation may be various electronic systems which operateusing processors, such as a computer, a server, a PDA (personal digitalassistant), a portable computer, a web tablet, a wireless phone, amobile phone, a smart phone, a digital music player, a PMP (portablemultimedia player), a camera, a global positioning system (GPS), a videocamera, a voice recorder, a telematics, an audio visual (AV) system, asmart television, and so on.

The processor 1210 decodes inputted commands and processes operation,comparison, etc. for the data stored in the system 1200, and controlsthese operations. The processor 1210 may include a microprocessor unit(MPU), a central processing unit (CPU), a single/multi-core processor, agraphic processing unit (GPU), an application processor (AP), a digitalsignal processor (DSP), and so on.

The main memory device 1220 is a storage which can temporarily store,call and execute program codes or data from the auxiliary memory device1230 when programs are executed and can conserve memorized contents evenwhen power supply is cut off. The main memory device 1220 may includeone or more of the above-described semiconductor devices in accordancewith the implementations. For example, the main memory device 1220 mayinclude: one or more columns; and a data line and a data line barconnected with a column selected among the one or more columns. Each ofthe one or more columns may include a plurality of storage cells eachconfigured to store 1-bit data, each storage cell including a firstvariable resistance element which has a first resistance value when afirst value is stored therein and a second resistance value when asecond value is stored therein and a second variable resistance elementwhich has the second resistance value when the first value is storedtherein and the first resistance value when the second value is storedtherein; a bit line connected to one end of the first variableresistance element; a bit line bar connected to one end of the secondvariable resistance element; a source line connected to the other endsof the first and second variable resistance elements; and a drivingblock configured to latch data of the data line and the data line barwhen a corresponding column is selected, the driving block configuredto, in a write operation, drive the bit line and the bit line bar with afirst voltage and a second voltage based on a value of the latched data,and the driving block further configured to, in a read operation, latchdata corresponding to a current flowing through the bit line and the bitline bar. Through this, a read margin of the main memory device 1220 maybe improved, speed of read and write operation of the memory unit may beincreased, and current and power consumption of the main memory device1220 may be decreased. Consequently, operation speed and stability ofthe system 1200 may be improved.

Also, the main memory device 1220 may further include a static randomaccess memory (SRAM), a dynamic random access memory (DRAM), and so on,of a volatile memory type in which all contents are erased when powersupply is cut off. Unlike this, the main memory device 1220 may notinclude the semiconductor devices according to the implementations, butmay include a static random access memory (SRAM), a dynamic randomaccess memory (DRAM), and so on, of a volatile memory type in which allcontents are erased when power supply is cut off.

The auxiliary memory device 1230 is a memory device for storing programcodes or data. While the speed of the auxiliary memory device 1230 isslower than the main memory device 1220, the auxiliary memory device1230 can store a larger amount of data. The auxiliary memory device 1230may include one or more of the above-described semiconductor devices inaccordance with the implementations. For example, the auxiliary memorydevice 1230 may include: one or more columns; and a data line and a dataline bar connected with a column selected among the one or more columns.Each of the one or more columns may include a plurality of storage cellseach configured to store 1-bit data, each storage cell including a firstvariable resistance element which has a first resistance value when afirst value is stored therein and a second resistance value when asecond value is stored therein and a second variable resistance elementwhich has the second resistance value when the first value is storedtherein and the first resistance value when the second value is storedtherein; a bit line connected to one end of the first variableresistance element; a bit line bar connected to one end of the secondvariable resistance element; a source line connected to the other endsof the first and second variable resistance elements; and a drivingblock configured to latch data of the data line and the data line barwhen a corresponding column is selected, the driving block configuredto, in a write operation, drive the bit line and the bit line bar with afirst voltage and a second voltage based on a value of the latched data,and the driving block further configured to, in a read operation, latchdata corresponding to a current flowing through the bit line and the bitline bar. Through this, a read margin of the auxiliary memory device1230 may be improved, speed of read and write operation of the memoryunit may be increased, and current and power consumption of theauxiliary memory device 1230 may be decreased. Consequently, operationspeed and stability of the system 1200 may be improved.

Also, the auxiliary memory device 1230 may further include a datastorage system (see the reference numeral 1300 of FIG. 13) such as amagnetic tape using magnetism, a magnetic disk, a laser disk usingoptics, a magneto-optical disc using both magnetism and optics, a solidstate disk (SSD), a USB memory (universal serial bus memory), a securedigital (SD) card, a mini secure digital (mSD) card, a micro securedigital (micro SD) card, a secure digital high capacity (SDHC) card, amemory stick card, a smart media (SM) card, a multimedia card (MMC), anembedded MMC (eMMC), a compact flash (CF) card, and so on. Unlike this,the auxiliary memory device 1230 may not include the semiconductordevices according to the implementations, but may include data storagesystems (see the reference numeral 1300 of FIG. 13) such as a magnetictape using magnetism, a magnetic disk, a laser disk using optics, amagneto-optical disc using both magnetism and optics, a solid state disk(SSD), a USB memory (universal serial bus memory), a secure digital (SD)card, a mini secure digital (mSD) card, a micro secure digital (microSD) card, a secure digital high capacity (SDHC) card, a memory stickcard, a smart media (SM) card, a multimedia card (MMC), an embedded MMC(eMMC), a compact flash (CF) card, and so on.

The interface device 1240 may be to perform exchange of commands anddata between the system 1200 of the present implementation and anexternal device. The interface device 1240 may be a keypad, a keyboard,a mouse, a speaker, a mike, a display, various human interface devices(HIDs), a communication device and so on. The communication device mayinclude a module capable of being connected with a wired network, amodule capable of being connected with a wireless network and both ofthem.

The wired network module may include a local area network (LAN), auniversal serial bus (USB), an Ethernet, power line communication (PLC),such as various devices which send and receive data through transmitlines, and so on. The wireless network module may include Infrared DataAssociation (IrDA), code division multiple access (CDMA), time divisionmultiple access (TDMA), frequency division multiple access (FDMA), awireless LAN, Zigbee, a ubiquitous sensor network (USN), Bluetooth,radio frequency identification (RFID), long term evolution (LTE), nearfield communication (NFC), a wireless broadband Internet (Wibro), highspeed downlink packet access (HSDPA), wideband CDMA (WCDMA), ultrawideband (UWB), such as various devices which send and receive datawithout transmit lines, and so on.

FIG. 13 is a configuration diagram of a data storage system based onanother implementation of the disclosed technology.

Referring to FIG. 13, a data storage system 1300 may include a storagedevice 1310 which has a nonvolatile characteristic as a component forstoring data, a controller 1320 which controls the storage device 1310,an interface 1330 for connection with an external device, and atemporary storage device 1340 for storing data temporarily. The datastorage system 1300 may be a disk type such as a hard disk drive (HDD),a compact disc read only memory (CDROM), a digital versatile disc (DVD),a solid state disk (SSD), and so on, and a card type such as a USBmemory (universal serial bus memory), a secure digital (SD) card, a minisecure digital (mSD) card, a micro secure digital (micro SD) card, asecure digital high capacity (SDHC) card, a memory stick card, a smartmedia (SM) card, a multimedia card (MMC), an embedded MMC (eMMC), acompact flash (CF) card, and so on.

The storage device 1310 may include a nonvolatile memory which storesdata semi-permanently. The nonvolatile memory may include a ROM (readonly memory), a NOR flash memory, a NAND flash memory, a phase changerandom access memory (PRAM), a resistive random access memory (RRAM), amagnetic random access memory (MRAM), and so on.

The controller 1320 may control exchange of data between the storagedevice 1310 and the interface 1330. To this end, the controller 1320 mayinclude a processor 1321 for performing an operation for, processingcommands inputted through the interface 1330 from an outside of the datastorage system 1300 and so on.

The interface 1330 is to perform exchange of commands and data betweenthe data storage system 1300 and the external device. In the case wherethe data storage system 1300 is a card type, the interface 1330 may becompatible with interfaces which are used in devices, such as a USBmemory (universal serial bus memory), a secure digital (SD) card, a minisecure digital (mSD) card, a micro secure digital (micro SD) card, asecure digital high capacity (SDHC) card, a memory stick card, a smartmedia (SM) card, a multimedia card (MMC), an embedded MMC (eMMC), acompact flash (CF) card, and so on, or be compatible with interfaceswhich are used in devices similar to the above mentioned devices.

In the case where the data storage system 1300 is a disk type, theinterface 1330 may be compatible with interfaces, such as IDE(Integrated Device Electronics), SATA (Serial Advanced TechnologyAttachment), SCSI (Small Computer System Interface), eSATA (ExternalSATA), PCMCIA (Personal Computer Memory Card International Association),a USB (universal serial bus), and so on, or be compatible with theinterfaces which are similar to the above mentioned interfaces. Theinterface 1330 may be compatible with one or more interfaces having adifferent type from each other. The temporary storage device 1340 canstore data temporarily implementation for efficiently transferring databetween the interface 1330 and the storage device 1310 according todiversifications and high performance of an interface with an externaldevice, a controller and a system. For example, the temporary storagedevice 1340 may include: one or more columns; and a data line and a dataline bar connected with a column selected among the one or more columns.Each of the one or more columns may include a plurality of storage cellseach configured to store 1-bit data, each storage cell including a firstvariable resistance element which has a first resistance value when afirst value is stored therein and a second resistance value when asecond value is stored therein and a second variable resistance elementwhich has the second resistance value when the first value is storedtherein and the first resistance value when the second value is storedtherein; a bit line connected to one end of the first variableresistance element; a bit line bar connected to one end of the secondvariable resistance element; a source line connected to the other endsof the first and second variable resistance elements; and a drivingblock configured to latch data of the data line and the data line barwhen a corresponding column is selected, the driving block configuredto, in a write operation, drive the bit line and the bit line bar with afirst voltage and a second voltage based on a value of the latched data,and the driving block further configured to, in a read operation, latchdata corresponding to a current flowing through the bit line and the bitline bar. Through this, a read margin of the temporary storage device1340 may be improved, speed of read and write operation of the memoryunit may be increased, and current and power consumption of thetemporary storage device 1340 may be decreased. Consequently, operationspeed and stability of the data storage system 1300 may be improved.

FIG. 14 is a configuration diagram of a memory system based on anotherimplementation of the disclosed technology.

Referring to FIG. 14, a memory system 1400 may include a memory 1410which has a nonvolatile characteristic as a component for storing data,a memory controller 1420 which controls the memory 1410, an interface1430 for connection with an external device, and so on. The memorysystem 1400 may be a card type such as a solid state disk (SSD), a USBmemory (universal serial bus memory), a secure digital (SD) card, a minisecure digital (mSD) card, a micro secure digital (micro SD) card, asecure digital high capacity (SDHC) card, a memory stick card, a smartmedia (SM) card, a multimedia card (MMC), an embedded MMC (eMMC), acompact flash (CF) card, and so on.

The memory 1410 for storing data may include: one or more columns; and adata line and a data line bar connected with a column selected among theone or more columns. Each of the one or more columns may include aplurality of storage cells each configured to store 1-bit data and eachincluding a first variable resistance element which has a firstresistance value when a first value is stored therein and a secondresistance value when a second value is stored therein and a secondvariable resistance element which has the second resistance value whenthe first value is stored therein and the first resistance value whenthe second value is stored therein; a bit line connected to one end ofthe first variable resistance element; a bit line bar connected to oneend of the second variable resistance element; a source line connectedto the other ends of the first and second variable resistance elements;and a driving block configured to latch data of the data line and thedata line bar when a corresponding column is selected and drive the bitline and the bit line bar with a first voltage and a second voltage,respectively, or with the second voltage and the first voltage,respectively, according to a value of the latched data, in a writeoperation, and latch data corresponding to current flowing through thebit line and the bit line bar in a read operation. Through this, a readmargin of the memory 1410 may be improved, speed of read and writeoperation of the memory unit may be increased, and current and powerconsumption of the memory 1410 may be decreased. Consequently, operationspeed and stability of the memory system 1400 may be improved.

Also, the memory 1410 according to the present implementation mayfurther include a ROM (read only memory), a NOR flash memory, a NANDflash memory, a phase change random access memory (PRAM), a resistiverandom access memory (RRAM), a magnetic random access memory (MRAM), andso on, which have a nonvolatile characteristic.

The memory controller 1420 may control exchange of data between thememory 1410 and the interface 1430. To this end, the memory controller1420 may include a processor 1421 for performing an operation for andprocessing commands inputted through the interface 1430 from an outsideof the memory system 1400.

The interface 1430 is to perform exchange of commands and data betweenthe memory system 1400 and the external device. The interface 1430 maybe compatible with interfaces which are used in devices, such as a USBmemory (universal serial bus memory), a secure digital (SD) card, a minisecure digital (mSD) card, a micro secure digital (micro SD) card, asecure digital high capacity (SDHC) card, a memory stick card, a smartmedia (SM) card, a multimedia card (MMC), an embedded MMC (eMMC), acompact flash (CF) card, and so on, or be compatible with interfaceswhich are used in devices similar to the above mentioned devices. Theinterface 1430 may be compatible with one or more interfaces having adifferent type from each other.

The memory system 1400 according to the present implementation mayfurther include a buffer memory 1440 for efficiently transferring databetween the interface 1430 and the memory 1410 according todiversification and high performance of an interface with an externaldevice, a memory controller and a memory system. For example, the buffermemory 1440 for temporarily storing data may include one or more of theabove-described semiconductor devices in accordance with theimplementations. The buffer memory 1440 may include: one or morecolumns; and a data line and a data line bar connected with a columnselected among the one or more columns. Each of the one or more columnsmay include a plurality of storage cells each configured to store 1-bitdata, each storage cell including a first variable resistance elementwhich has a first resistance value when a first value is stored thereinand a second resistance value when a second value is stored therein anda second variable resistance element which has the second resistancevalue when the first value is stored therein and the first resistancevalue when the second value is stored therein; a bit line connected toone end of the first variable resistance element; a bit line barconnected to one end of the second variable resistance element; a sourceline connected to the other ends of the first and second variableresistance elements; and a driving block configured to latch data of thedata line and the data line bar when a corresponding column is selected,the driving block configured to, in a write operation, drive the bitline and the bit line bar with a first voltage and a second voltagebased on a value of the latched data, and the driving block furtherconfigured to, in a read operation, latch data corresponding to acurrent flowing through the bit line and the bit line bar. Through this,a read margin of the buffer memory 1440 may be improved, speed of readand write operation of the memory unit may be increased, and current andpower consumption of the buffer memory 1440 may be decreased.Consequently, operation speed and stability of the memory system 1400may be improved.

Moreover, the buffer memory 1440 according to the present implementationmay further include an SRAM (static random access memory), a DRAM(dynamic random access memory), and so on, which have a volatilecharacteristic, and a phase change random access memory (PRAM), aresistive random access memory (RRAM), a spin transfer torque randomaccess memory (STTRAM), a magnetic random access memory (MRAM), and soon, which have a nonvolatile characteristic. Unlike this, the buffermemory 1440 may not include the semiconductor devices according to theimplementations, but may include an SRAM (static random access memory),a DRAM (dynamic random access memory), and so on, which have a volatilecharacteristic, and a phase change random access memory (PRAM), aresistive random access memory (RRAM), a spin transfer torque randomaccess memory (STTRAM), a magnetic random access memory (MRAM), and soon, which have a nonvolatile characteristic.

Features in the above examples of electronic devices or systems in FIGS.10-14 based on the memory devices disclosed in this document may beimplemented in various devices, systems or applications. Some examplesinclude mobile phones or other portable communication devices, tabletcomputers, notebook or laptop computers, game machines, smart TV sets,TV set top boxes, multimedia servers, digital cameras with or withoutwireless communication functions, wrist watches or other wearabledevices with wireless communication capabilities.

While this patent document contains many specifics, these should not beconstrued as limitations on the scope of any invention or of what may beclaimed, but rather as descriptions of features that may be specific toparticular embodiments of particular inventions. Certain features thatare described in this patent document in the context of separateembodiments can also be implemented in combination in a singleembodiment. Conversely, various features that are described in thecontext of a single embodiment can also be implemented in multipleembodiments separately or in any suitable subcombination. Moreover,although features may be described above as acting in certaincombinations and even initially claimed as such, one or more featuresfrom a claimed combination can in some cases be excised from thecombination, and the claimed combination may be directed to asubcombination or variation of a subcombination.

Similarly, while operations are depicted in the drawings in a particularorder, this should not be understood as requiring that such operationsbe performed in the particular order shown or in sequential order, orthat all illustrated operations be performed, to achieve desirableresults. Moreover, the separation of various system components in theembodiments described in this patent document should not be understoodas requiring such separation in all embodiments.

Only a few implementations and examples are described. Otherimplementations, enhancements and variations can be made based on whatis described and illustrated in this patent document.

1-20. (canceled)
 21. An electronic device including a semiconductormemory unit, the semiconductor memory unit comprising: a cell arrayincluding first bit lines, first bit line bars, second bit lines, secondbit line bars, and a plurality of storage cells which are connected withthe first bit lines and the first bit line bars or with the second bitlines and the second bit line bars, and wherein each storage cell isstructured to store 1-bit data by including a first variable resistanceelement having a first resistance value when a first value is storedtherein and a second resistance value when a second value is storedtherein, and a second variable resistance element having the secondresistance value when the first value is stored therein and the firstresistance value when the second value is stored therein; a first dataline and a first data line bar disposed on a first side of the cellarray; a second data line and a second data line bar disposed on asecond side of the cell array; one or more first driving blocks disposedon the first side of the cell array and connected to the storage cellsthrough the first bit lines and the first bit line bars, each firstdriving block configured, during a write operation, to latch data of acorresponding first data line and a corresponding first data line barand drive the corresponding first bit line and the corresponding firstbit line bar with a first voltage or a second voltage according to avalue of the latched data and configured, during a read operation, latchdata stored in a corresponding storage cell based on a current flowingthrough the corresponding first bit line and the corresponding first bitline bar; and one or more second driving blocks disposed on the secondside of the cell array, and connected to storage cells through thesecond bit lines and the second bit line bars, each second driving blockconfigured, during a write operation, to latch data of a correspondingsecond data line and a corresponding second data line bar and drive thecorresponding second bit line and the corresponding second bit line barwith a first voltage or a second voltage according to a value of thelatched data and configured, during a read operation to latch datastored in a corresponding storage cell based on current flowing throughthe corresponding second bit line and the corresponding second bit linebar.
 22. The electronic device according to claim 21, wherein thesemiconductor memory unit comprises a plurality of source lines to whicha ground voltage is applied during the read operation and are floatedduring the write operation, and wherein one end of each first variableresistance element is connected to a corresponding bit line, one end ofeach second variable resistance element is connected to a correspondingbit line bar, and the other ends of the first and second variableresistance elements are connected to a corresponding source line. 23.The electronic device according to claim 22, wherein, in the writeoperation, resistance values of the first variable resistance elementand the second variable resistance element are switched based ondirections of currents flowing through the first resistance element andthe second resistance element, respectively.
 24. The electronic deviceaccording to claim 21, wherein the at least one first driving block andthe at least one second driving block latch the first value when anamount of current flowing thorough the bit line is greater than anamount of current flowing through the bit line bar, and latch the secondvalue when an amount of current flowing thorough the bit line is smallerthan an amount of current flowing through the bit line bar.
 25. Theelectronic device according to claim 21, wherein each of the first andsecond driving blocks is further connected to a first driving line and asecond driving line on both ends thereof, respectively, and configuredsuch that, when a corresponding driving block is selected, the firstdriving line and the second driving line are connected with acorresponding data line and a corresponding data line bar, respectively,and wherein each of the first and second driving blocks drives the bitline through the first driving line and the bit line bar through thesecond driving line.
 26. The electronic device according to claim 25,wherein, in the write operation, each first driving block and eachsecond driving block drive the first driving line with the first voltageand the second driving line with the second voltage when the value ofthe latched data is the first value, and drive the first driving linewith the second voltage and the second driving line with the firstvoltage when the value of the latched data is the second value.
 27. Theelectronic device according to claim 25, wherein, in the read operation,each first driving block and each second driving block drive the firstdriving line and the second driving line with the first voltage and thesecond voltage, respectively, when the amount of current flowing throughthe bit line is greater than the amount of current flowing through thebit line bar, and drive the first driving line and the second drivingline with the second voltage and the first voltage, respectively, whenthe amount of current flowing through the bit line is smaller than theamount of current flowing through the bit line bar.
 28. The electronicdevice according to claim 21, wherein each of the first and seconddriving blocks drive both ends with same voltage level during aprecharge period.
 29. The electronic device according to claim 25,wherein each of the first and second driving blocks comprises: a firstPMOS transistor having one end which is connected to the first drivingline and the other end which is applied with a power supply voltage, andconfigured to be turned on and off in response to a voltage of thesecond driving line; a second PMOS transistor having one end which isconnected to the second driving line and the other end which is appliedwith the power supply voltage, and configured to be turned on and off inresponse to a voltage of the first driving line; a first NMOS transistorhaving one end which is connected to the first driving line and theother end which is connected to an internal node, and configured to beturned on and off in response to the voltage of the second driving line;a second NMOS transistor having one end which is connected to the seconddriving line and the other end which is connected to the internal node,and configured to be turned on and off in response to the voltage of thefirst driving line; a third NMOS transistor having one end which isconnected to the internal node and the other end which is applied withthe ground voltage, and configured to be turned on and off in responseto an enable signal which is activated during an activation period ofthe driving block and is deactivated during a deactivation period of thedriving block; and a third PMOS transistor having one end which isconnected to the first driving line and the other end which is connectedto the second driving line, and configured to be turned on and off inresponse to the enable signal.
 30. The electronic device according toclaim 29, wherein the third PMOS transistor turns off when the enablesignal is activated, and turns on when the enable signal is deactivated.31. The electronic device according to claim 21, wherein the firstvariable resistance element and the second variable resistance elementinclude at least one of a metal oxide and a structure in which a tunnelbarrier layer is interposed between two ferromagnetic layers.
 32. Theelectronic device according to claim 21, further comprising amicroprocessor which includes: a control unit that is configured toreceive a signal including a command from an outside of themicroprocessor, and performs extracting, decoding of the command, orcontrolling input or output of a signal of microprocessor; and anoperation unit configured to perform an operation based on a result thatthe control unit decodes the command; and a memory unit configured tostore data for performing the operation, data corresponding to a resultof performing the operation, or an address of data for which theoperation is performed, wherein the semiconductor memory unit thatincludes the variable resistance element is part of the memory unit inthe microprocessor.
 33. The electronic device according to claim 21,further comprising a processor which includes: a core unit configured toperform, based on a command inputted from an outside of the processor,an operation corresponding to the command, by using data; a cache memoryunit configured to store data for performing the operation, datacorresponding to a result of performing the operation, or an address ofdata for which the operation is performed; and a bus interface connectedbetween the core unit and the cache memory unit, and configured totransmit data between the core unit and the cache memory unit, whereinthe semiconductor memory unit that includes the variable resistanceelement is part of the cache memory unit in the processor.
 34. Theelectronic device according to claim 21, further comprising a processingsystem which includes: a processor configured to decode a commandreceived by the processor and control an operation for information basedon a result of decoding the command; an auxiliary memory deviceconfigured to store a program for decoding the command and theinformation; a main memory device configured to call and store theprogram and the information from the auxiliary memory device such thatthe processor can perform the operation using the program and theinformation when executing the program; and an interface deviceconfigured to perform communication between the processor, the auxiliarymemory device or the main memory device and the outside, wherein thesemiconductor memory unit that includes the variable resistance elementis part of the auxiliary memory device or the main memory device in theprocessing system.
 35. The electronic device according to claim 21,further comprising a data storage system which includes: a storagedevice configured to store data and conserve stored data regardless ofpower supply; a controller configured to control input and output ofdata to and from the storage device according to a command inputted forman outside; a temporary storage device configured to temporarily storedata exchanged between the storage device and the outside; and aninterface configured to perform communication between at least one ofthe storage device, the controller and the temporary storage device andthe outside, wherein the semiconductor memory unit that includes thevariable resistance element is part of the storage device or thetemporary storage device in the data storage system.
 36. The electronicdevice according to claim 21, further comprising a memory system whichincludes: a memory configured to store data and conserve stored dataregardless of power supply; a memory controller configured to controlinput and output of data to and from the memory according to a commandinputted form an outside; a buffer memory configured to buffer dataexchanged between the memory and the outside; and an interfaceconfigured to perform communication between at least one of the memory,the memory controller and the buffer memory and the outside, wherein thesemiconductor memory unit that includes the variable resistance elementis part of the memory or the buffer memory in the memory system.
 37. Theelectronic device according to claim 21, wherein the first bit lines andthe first bit line bars are disposed on the first side of the cell arrayand the second bit lines and the second bit line bars are disposed onthe second side of the cell array.
 38. The electronic device accordingto claim 21, wherein each of the first and second variable resistanceelements in each storage cell include a magnetic tunnel junction (MTJ)element that includes two ferromagnetic layers and a tunneling barrierlayer interposed between the two ferromagnetic layers.
 39. Theelectronic device according to claim 21, wherein the first variableresistance element or the second variable resistance element in eachstorage cell includes an RRAM (resistive random access memory) element,a PRAM (phase change random access memory) element, or an FRAM(ferroelectric random access memory) element.